适用于SiC MOSFET的漏源电压积分自适应快速短路保护电路研究OA北大核心CSTPCD
Research on Drain-source Voltage Integration-based Adaptive Fast Short-circuit Protection Circuit for SiC MOSFET
SiC MOSFET因其高击穿电压、高开关速度、低导通损耗等性能优势而被广泛应用于各类电力电子变换器中.然而,由于其短路耐受时间仅为2~7 μs,且随母线电压升高而缩短,快速可靠的短路保护电路已成为其推广应用的关键技术之一.为应对不同母线电压下的SiC MOSFET短路故障,文中提出一种基于漏源电压积分的自适应快速短路保护方法(drain-source voltage integration-based adaptive fast short-circuit protection method,DSVI-AFSCPM),研究所提出的 DSVI-AFSCPM 在硬开关短路(hard switching fault,HSF)和负载短路(fault under load,FUL)条件下的保护性能,进而研究不同母线电压对 DSVI-AFSCPM 的作用机理.同时,探究SiC MOSFET工作温度对其响应速度的影响.最后,搭建实验平台,对所提出的 DSVI-AFSCPM 在发生硬开关短路和负载短路时不同母线电压、不同工作温度下的保护性能进行实验测试.实验结果表明,所提出的DSVI-AFSCPM 在不同母线电压下具有良好的保护速度自适应性,即母线电压越高,短路保护速度越快,并且其响应速度受SiC MOSFET工作温度影响较小,两种短路工况下工作温度从 25℃变化到 125℃,短路保护时间变化不超过90 ns.因此,该文为SiC MOSFET在不同母线电压下的可靠使用提供一定技术支撑.
SiC MOSFETs have been widely used in various power electronic converters because of their high breakdown voltage,high switching speed,and low switching loss.However,since the short-circuit withstand time of SiC MOSFETs is only 2~7 μs and will be shortened with the increase of bus voltage,a fast and reliable short-circuit protection circuit has become one of the key technologies for their popularization and application.In order to deal with short-circuit faults at different bus voltages,this paper proposes a drain-source voltage integration-based adaptive fast short-circuit protection method(DSVI-AFSCPM).The protection performance of the proposed DSVI-AFSCPM is studied under hard switching fault(HSF)and fault under load(FUL).Furthermore,the action mechanism of different bus voltages on DSVI-AFSCPM is studied.At the same time,the influence of SiC MOSFET operating temperature on its response speed is explored.Finally,an experimental platform is built to test the protection performance of the proposed DSVI-AFSCPM at different bus voltages and operating temperatures under conditions of HSF and FUL.The experimental results show that the DSVI-AFSCPM proposed in this paper has excellent protection speed adaptability at different bus voltages,namely,the higher the bus voltage,the faster the short-circuit protection speed.And its response speed is less affected by the operating temperature of SiC MOSFET.Under the two short-circuit conditions,the operating temperatures change from 25℃to 125℃,and the short-circuit protection time doesn't change more than 90 ns.Therefore,this paper provides technical support for the reliable use of SiC MOSFET at different bus voltages.
李虹;胡肖飞;王玉婷;曾洋斌
北京交通大学电气工程学院,北京市 海淀区 100044广东电网有限责任公司韶关供电局,广东省 韶关市 512028清华大学电机工程与应用电子技术系,北京市 海淀区 100084
动力与电气工程
碳化硅金属氧化物半导体场效应晶体管短路保护漏源电压积分母线电压自适应
silicon carbide metal-oxide-semiconductor field-effect transistor(SiC MOSFET)short-circuit protectiondrain-source voltage integrationbus voltageadaptive
《中国电机工程学报》 2024 (004)
1542-1552,中插24 / 12
国家自然科学基金杰出青年基金项目(52325704);国家自然科学基金(重点项目)(52237008). Project Supported by the Distinguished Youth Scholars of National Natural Science Foundation of China(52325704);National Natural Science Foundation of China(Key Project)(52237008).
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