系统级单粒子效应试验方法研究OACSTPCD

To evaluate the single event effects vulnerability of electronic systems being used in space environment,and verify the effective-ness of system-level hardening methods against radiation,this article conducts relevant research on system level single event effect testing methods.Feasibility of irradiating devices in electronic systems one by one under laboratory environment to evaluate single event func-tional interrupt rate is confirmed.It is suggested that many methods could be used to get the vulnerability data of devices.The procedure to directly sum up the cross section value corresponding to each device is pointed out to be not reasonable.Through all the above sugges-tions,it is able to support the test for system-level single event effects.