集成电路与嵌入式系统2024，Vol.24Issue(3)：23-26,4.
系统级单粒子效应试验方法研究
Study of test method for system-level single event effects
摘要
Abstract
To evaluate the single event effects vulnerability of electronic systems being used in space environment,and verify the effective-ness of system-level hardening methods against radiation,this article conducts relevant research on system level single event effect testing methods.Feasibility of irradiating devices in electronic systems one by one under laboratory environment to evaluate single event func-tional interrupt rate is confirmed.It is suggested that many methods could be used to get the vulnerability data of devices.The procedure to directly sum up the cross section value corresponding to each device is pointed out to be not reasonable.Through all the above sugges-tions,it is able to support the test for system-level single event effects.关键词
系统级/单粒子效应/试验方法/功能中断率Key words
system-level/single event effects/test method/functional interrupt rate分类
信息技术与安全科学引用本文复制引用
丁李利,陈伟,郭晓强,张凤祁,姚志斌,吴伟..系统级单粒子效应试验方法研究[J].集成电路与嵌入式系统,2024,24(3):23-26,4.基金项目
国家自然科学基金(12105229). （12105229）
