首页|期刊导航|半导体学报（英文版）|Electronic origin of structural degradation in Li-rich transition metal oxides:The case of Li2MnO3 and Li2RuO3
半导体学报（英文版）2024，Vol.45Issue(4)：83-87,5.DOI:10.1088/1674-4926/45/4/042801
Electronic origin of structural degradation in Li-rich transition metal oxides:The case of Li2MnO3 and Li2RuO3
Electronic origin of structural degradation in Li-rich transition metal oxides:The case of Li2MnO3 and Li2RuO3
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defects/Li-ion batteries/first-principles calculationsKey words
defects/Li-ion batteries/first-principles calculations引用本文复制引用
Peng Zhang..Electronic origin of structural degradation in Li-rich transition metal oxides:The case of Li2MnO3 and Li2RuO3[J].半导体学报（英文版）,2024,45(4):83-87,5.基金项目
This work was supported by Guangdong Basic and Applied Basic Research Foundation(2021A1515010219,2022A1515011990,and 2023A1515030086),Shenzhen High-Talent Research Foundation(827-000561),Shenzhen Science and Technology Program(KQTD20180412181422399 and JCYJ20220531102601004),High-Level University Construc-tion Funds of SZU(866-000002110709),National Key R&D Program of China(2019YFB2204500),Science and Technology Innovation Commission of Shenzhen(JCYJ20180507181858539),and the National Natural Science Foundation of China(11991060,12088101,and U2230402).In addition,we also gratefully acknowledge HZWTECH for provid-ing computation facilities. （2021A1515010219,2022A1515011990,and 2023A1515030086）
