p型"SE+PERC"双面太阳电池背面工艺对光伏组件PID效应的影响研究OA

Based on the back technology of p-type"SE+PERC"bifacial solar cells,this paper studies the influence of the back surface polishing state,the thickness of Al2O3 thin film on the back,the film structures on the back,and the refractive index of SixNy thin films on the back on the potential induced attenuation(PID)effect of PV modules.The research results show that:1)The smoother the polishing state of the back surface,the smaller the output power loss rate of the PV module prepared after PID testing.2)When the thickness of the Al2O3 thin film on the back is 10 nm or more,there is not much difference in the output power loss rate of the PV module prepared after PID testing.3)The film structure on the back has an impact on the PID effect,and reasonable design of the film structure on the back can effectively inhibit the PID effect of PV modules.4)When the refractive index of the SixNy thin film on the back is greater than or equal to 2.10,the output power loss rate of the PV module prepared after PID testing decreases to within 2.00%and can be stably maintained at a lower level.The research results can provide guidance for the optimization of the back technology of p-type"SE+PERC"bifacial solar cells.