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Reliability evaluation of IGBT power module on electric vehicle using big data

Li Liu Lei Tang Huaping Jiang Fanyi Wei Zonghua Li Changhong Du Qianlei Peng Guocheng Lu

Journal of Semiconductors2024,Vol.45Issue(5):P.50-60,11.
Journal of Semiconductors2024,Vol.45Issue(5):P.50-60,11.DOI:10.1088/1674-4926/45/5/052301

Reliability evaluation of IGBT power module on electric vehicle using big data

Li Liu 1Lei Tang 2Huaping Jiang 2Fanyi Wei 3Zonghua Li 3Changhong Du 3Qianlei Peng 3Guocheng Lu3

作者信息

  • 1. The School of Electrical Engineering,Chongqing University,Chongqing 400044,China The Deepal Automobile Technology Co.,Ltd.,Chongqing 400023,China
  • 2. The School of Electrical Engineering,Chongqing University,Chongqing 400044,China
  • 3. The Deepal Automobile Technology Co.,Ltd.,Chongqing 400023,China
  • 折叠

摘要

关键词

IGBT/junction temperature/neural network/electric vehicles/big data

分类

交通工程

引用本文复制引用

Li Liu,Lei Tang,Huaping Jiang,Fanyi Wei,Zonghua Li,Changhong Du,Qianlei Peng,Guocheng Lu..Reliability evaluation of IGBT power module on electric vehicle using big data[J].Journal of Semiconductors,2024,45(5):P.50-60,11.

Journal of Semiconductors

OACSTPCDEI

1674-4926

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