集成电路与嵌入式系统2024，Vol.24Issue(5)：88-93,6.
基于通用测试平台的AD73360测试子卡设计
Design of AD73360 test sub-card based on universal test platform
于吉刚 1侯伟盟 1谭加加1
作者信息
- 1. 中国电子科技集团公司第58研究所,无锡 214035
- 折叠
摘要
Abstract
Based on the existing ZYNQ+FPGA ADC universal testing platform of the 58th China Electronics Technology Group Corpo-ration,this paper carries out a detailed dynamic index test for the six-channel analog-to-digital conversion device AD73360.Data processing and analysis are realized by invoking MATLAB in LabVIEW of upper computer.As a result of the acquisition control and processing system has been designed,the design is mainly for AD73360 slave card's hardware design,concrete dynamic testing methods and PC by detailed test.Through comparing the manual gives typical dynamic index,the slave card performance can satisfy the performance index of AD73360.关键词
ADC/LabVIEW/AD73360/动态指标/ZYNQKey words
ADC/LabVIEW/AD73360/dynamic specifications/ZYNQ分类
信息技术与安全科学引用本文复制引用
于吉刚,侯伟盟,谭加加..基于通用测试平台的AD73360测试子卡设计[J].集成电路与嵌入式系统,2024,24(5):88-93,6.
