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用于特殊环境的薄膜应变计的制备与表征

张丛春 康志鹏 雷鹏 闫博

传感技术学报2024,Vol.37Issue(4):589-596,8.
传感技术学报2024,Vol.37Issue(4):589-596,8.DOI:10.3969/j.issn.1004-1699.2024.04.005

用于特殊环境的薄膜应变计的制备与表征

Fabrication And Characterization of Thin Film Strain Gauge for Strain Measurement Under Special Environment

张丛春 1康志鹏 2雷鹏 2闫博2

作者信息

  • 1. 上海交通大学微米/纳米加工技术国家重点实验室,上海 200240,China
  • 2. 上海交通大学微米/纳米加工技术国家重点实验室,上海 200240,China||上海交通大学电子信息与电气工程学院,上海 200240,China
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摘要

Abstract

RF sputtering is used to create Karma alloy thin film strain gauges on alumina substrates.Karma alloy thin films'changes in e-lectrical characteristics and strain properties at various annealing temperatures are evaluated,and it is determined how annealing tempera-ture affects the surface morphology and crystal structure of Karma alloy thin films.The results demonstrate that as the annealing tempera-ture increases,the resistivity of the Karma alloy thin films gradually decreases,and its temperature coefficient of resistance gradually in-creases.Karma thin film strain gages are discovered to have the lowest TCR of 59.9×10-6/℃under room temperature.After 200℃an-nealing process,the Karma alloy thin films achieve the gage factor of 2.2,and the TCR of 64.4×10-6/℃.The piezoresistive characteristic of the thin film changes slightly after experiments of temperature humidity cycling,salt spray,and molding,it has ability to withstand the harsh conditions of the sea.

关键词

磁控溅射/薄膜应变计/电阻温度系数/应变因子/环境实验

Key words

magnetron sputtering/thin-film strain gauge/resistance temperature coefficient/strain factor/environmental experiments

分类

信息技术与安全科学

引用本文复制引用

张丛春,康志鹏,雷鹏,闫博..用于特殊环境的薄膜应变计的制备与表征[J].传感技术学报,2024,37(4):589-596,8.

基金项目

2023年度"慧眼行动"项目 ()

传感技术学报

OA北大核心CSTPCD

1004-1699

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