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高功率微波频率对PIN限幅器的影响分析OA北大核心CSTPCD

Effect Analysis of High Power Microwave Frequency on PIN Limiter

中文摘要英文摘要

通过TCAD器件建模,建立了PIN二极管的电热耦合模型,搭建PIN限幅器HPM耦合仿真电路以进行高功率微波效应仿真.仿真得到了不同频率下PIN限幅器瞬态电压响应以及PIN二极管内部电场、载流子、结温分布.仿真结果表明,在HPM耦合电压作用下,PIN限幅器平顶泄漏负向电压随频率增大而降低,PIN限幅器平顶泄漏正向电压随频率增大而降低.PIN二极管内部PIN限幅器的限幅能力随微波频率增加先增强后减弱.HPM频率较低时PIN二极管内部晶格温度积累集中于I层界面处,随着频率升高,晶格温度积累集中于I层中间位置,因此频率变化会造成PIN限幅器的HPM毁伤敏感位置变化.

In this paper,a PIN diode model is established through Technology Computer Aided Design(TCAD)device modeling,and a High-Power Microwave(HPM)coupling simulation circuit is built on a PIN limiter to simulate effects of HPM.The transient voltage response of the PIN limiter under different HPM frequencies are obtained by simulation,as well as the internal electric field,carrier and junction temperature distribution of the PIN diode.The simulation results show that the flat-top leakage negative voltage of PIN limiter decreases with the increase of HPM frequency,and the flat-top leakage forward voltage of PIN limiter decreases with the increase of HPM frequency.The limiting capability of the PIN limiter inside the PIN diode first increases and then decreases with the increase of the microwave frequency.When the HPM frequency is low,the internal lattice temperature accumulation of the PIN diode is concentrated at the interface of layer I.Therefore,the HPM damage sensitive position of the PIN limiter varies with frequency.

张兵;方子璇;彭帅;陆凤波;高文泽;赵银峰;王树龙

中国船舶集团有限公司系统工程研究院,北京 100094海军研究院,北京 100161西安电子科技大学微电子学院,西安 710071

电子信息工程

高功率微波PIN限幅器电热耦合模型平顶泄漏电压

HPMPIN limiterelectrothermal coupling modelflat-top leakage voltage

《电子科技大学学报》 2024 (003)

321-326 / 6

部级基金

10.12178/1001-0548.2022358

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