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范德瓦尔斯异质结柔性晶体管在动态应变下的电学性能测量

陈姜龙 王曾晖

电子科技大学学报2024,Vol.53Issue(3):345-351,7.
电子科技大学学报2024,Vol.53Issue(3):345-351,7.DOI:10.12178/1001-0548.2023104

范德瓦尔斯异质结柔性晶体管在动态应变下的电学性能测量

Characterization of Electrical Properties of Flexible Transistors Based on van der Waals Heterostructure Under Dynamic Strain Modulation

陈姜龙 1王曾晖1

作者信息

  • 1. 电子科技大学基础与前沿研究院,成都 611731
  • 折叠

摘要

Abstract

Conventional electronic devices are mainly composed of inorganic semiconductor materials such as silicon-based and rigid polymer insulating substrate materials,which are the basis of existing electronic technology.Although the traditional electronic technology has been developed,but due to the limitations of the material,resulting in the field of flexible electronics,its application still exists in a certain limit.Two-dimensional materials have high crystallinity,near-perfect lattice structure,atomic-level thickness and high mechanical tensile strength,and exhibit excellent charge-transfer properties,making them promising for applications in the field of flexible electronics.The paper takes advantage of the excellent mechanical properties of graphene,molybdenum disulfide and hexagonal boron nitride to prepare molybdenum disulfide-based field effect transistors by adopting mechanical exfoliation method and dry transfer.A self-built flexible test platform is used to test the flexible electrical performance of the device.The test results show that the designed two-dimensional heterojunction transistor has only a small change in electrical properties under static test conditions;however,under dynamic test conditions,due to the too small van der Waals force between layers,the sliding or displacement between layers makes the electrical properties of the device change significantly.

关键词

二维材料/场效应晶体管/柔性器件/电学特性

Key words

two-dimensional material/field effect transistors/flexible devices/electrical characteristics

分类

信息技术与安全科学

引用本文复制引用

陈姜龙,王曾晖..范德瓦尔斯异质结柔性晶体管在动态应变下的电学性能测量[J].电子科技大学学报,2024,53(3):345-351,7.

基金项目

四川省科技厅四川省青年科技创新研究团队项目(2021JDTD0028) (2021JDTD0028)

电子科技大学学报

OA北大核心CSTPCD

1001-0548

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