测控技术2024，Vol.43Issue(5)：56-65,10.DOI:10.19708/j.ckjs.2024.05.006
以太网物理层芯片光电特性测试研究
Test and Research of Ethernet Physical Layer Chip Photoelectric Characteristics
摘要
Abstract
At present,Ethernet physical layer chip is indispensable in the field of many applications,and the functional performance requirements of Ethernet physical layer chip is getting higher and higher.Therefore,how to verify the photoelectric characteristics of chip functional performance is an urgent problem to be solved.The technical status of verification of Ethernet physical layer chip is mainly introduced,and a photoelectric charac-teristic test method that meets the functional performance application requirements of Ethernet physical layer chip is put forward.Test instruments(such as oscilloscope,logic analyzer,network vector analyzer,etc.)and verification board are used to test the electrical and optical characteristics of data transmission of physical inter-faces in the network.The test results show that the proposed test method meets the test requirements,meets the application requirements of functional performance,and then improves the technical means of domestic high re-liability Ethernet physical layer chip verification.关键词
芯片验证/物理层芯片/光电特性验证Key words
chip verification/physical layer chip/verification of photoelectric characteristics分类
信息技术与安全科学引用本文复制引用
杨峰,许少尉,陈思宇..以太网物理层芯片光电特性测试研究[J].测控技术,2024,43(5):56-65,10.基金项目
航空科学基金(6141B05060402) （6141B05060402）
