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基于质量保证前移的TSV硅转接板检验评价方法OACSTPCD

Quality and reliability evaluation methods for TSV silicon interposers based on assurance forward movement

中文摘要英文摘要

TSV作为目前公认最先进的新型高密度封装工艺之一,其结构工艺极为复杂,当前国内鲜有大规模应用及工程适用的质量与可靠性评价方法,相关统一标准尚未完全建立.本文以 目前相对成熟并已形成行业共识的2.5D封装中TSV硅转接板为对象,结合其工艺结构特点以及实际产品生产试验的一线数据,研究提出了基于保证前移TSV硅转接板质量检验及可靠性评价方法,为TSV工艺产品的工艺质量监控、检验评价、可靠性保证及相关标准规范制定提供了一套成熟的解决方案.

As one of the most advanced new high-density packaging processes,TSV has an extremely complex structural process.Cur-rently,there are few quality inspection and reliability evaluation methods for large-scale applications and engineering applications in China,and relevant unified standards have not been fully established.This paper focuses on TSV silicon interposers in 2.5D packaging,which are the relatively mature and reach the industry consensus.Combining its process structure characteristics and front-line data from actual product production testing,the quality inspection method and the reliability evaluation method for TSV silicon interposers based on the forward movement of quality assurance are studied.A mature solution is established for the process quality monitoring,inspec-tion evaluation,reliability assurance,and the establishment of related standards and specifications for TSV process products.

刘莹莹;刘沛;付琬月;付予;张立康

中国航天标准化与产品保证研究院,北京 100071

电子信息工程

TSV硅转接板质量检验可靠性评价2.5D封装

TSVsilicon interposerquality inspectionreliability evaluation2.5D packaging

《集成电路与嵌入式系统》 2024 (007)

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