红外与毫米波学报2024，Vol.43Issue(3)：302-306,5.DOI:10.11972/j.issn.1001-9014.2024.03.002
Hg0.72Cd0.28Te扫描隧道谱的模型解释
Model interpretation of Hg0.72Cd0.28Te scanning tunneling spectra
摘要
Abstract
The cross-sectional scanning tunneling microscopy(XSTM)technique was used to study the cleaved surface of Hg0.72Cd0.28Te grown by molecular beam epitaxy.Measurements of scanning tunnel spectroscopy(STS)show that the width of zero current plateau(the apparent tunneling gap)of current-voltage(Ⅰ/Ⅴ)spectra is about 130％larger than the practical band gap of the material,implying the existence of obvious tip-induced band bending(TIBB)effect with the measurement.Based on the 3D TIBB model,the STS data can however be interpreted and the calculated Ⅰ/Ⅴ spectra are in good agreement with the measurement.Nevertheless,certain deviation appears for those Ⅰ/Ⅴ data which were ac-quired with a large imaging bias.This is because the current TIBB model does not take into account the transport mecha-nism of the material itself,for which the band-to-band tunneling,trap assisted tunneling etc.could be non-negligible factors for the tunneling.关键词
扫描隧道显微镜/扫描隧道谱/HgCdTe/针尖诱导能带弯曲Key words
scanning tunneling microscopy/scanning tunneling spectroscopy/HgCdTe/tip-induced band bending分类
数理科学引用本文复制引用
肖正琼,戴昊光,刘欣扬,陈平平,查访星..Hg0.72Cd0.28Te扫描隧道谱的模型解释[J].红外与毫米波学报,2024,43(3):302-306,5.基金项目
国家自然科学基金面上项目(61874069) Supported by the General Program of National Natural Science Foundation of China(61874069) （61874069）
