现代应用物理2024，Vol.15Issue(3)：68-74,7.DOI:10.12061/j.issn.2905-6223.2024.030403
预电离间隙击穿特性及其对中储开关击穿稳定性的影响
Characteristics of Pre-Ionization Gap's Breakdown and Its Effects on the Breakdown Stability of Transfer Switch
摘要
Abstract
UV pre-ionization transfer switch is the key device for the large-scale high-altitude electromagnetic pulse simulator,and the breakdown characteristic of the pre-ionization gap is an important parameter that influences the performance of the transfer switch.The characteristics of pre-ionization gap's breakdown and its effects on the breakdown stability of transfer switch within the working pressure range of N2 from 0.1 to 0.7 MPa are studied.The results show that as the pressure increases,the breakdown voltage of the pre-ionization gap presents different characteristics.In cases where the gap is short,the breakdown occurs in the gaseous medium between the tungsten needle and the copper electrode in the pre-ionisation gap,and the breakdown voltage exhibits a gradual saturation trend.As the gap distance increases,breakdown at lower pressures occurs within the pre-ionization gap,while at higher gas pressures,breakdowns occur within the ceramic sleeve of the pre-ionization electrode,with the breakdown voltage remaining almost constant.Additionally,an experiment using the pre-ionization gap is conducted in the electromagnetic pulse simulator for the transfer switch.It is observed that when the switch operates at gas higher pressures,the breakdown dispersion is greater compared to the low-pressure region.This observation could be attributed to the flashover phenomenon on the ceramic sleeve of the pre-ionization electrode,resulting in premature breakdown of the main gap.The time difference between the breakdown of the pre-ionization gap and the peak waveform in the main gap is greater than the formation time of the breakdown process in the main gap,thus leading to an increased breakdown voltage dispersion in the main gap.关键词
电磁脉冲模拟装置/紫外预电离开关/击穿/形成时延/饱和现象Key words
electromagnetic pulse simulator/UV pre-ionization switch/breakdown/formation time/saturation phenomenon分类
信息技术与安全科学引用本文复制引用
陈志强,王天驰,王艺,郭帆,贾伟,谢霖燊,吴伟,陈伟..预电离间隙击穿特性及其对中储开关击穿稳定性的影响[J].现代应用物理,2024,15(3):68-74,7.基金项目
强脉冲辐射环境模拟与效应全国重点实验室基金资助项目(SKLIPR2101) （SKLIPR2101）
