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基于55K SNP芯片的小麦籽粒主要品质性状的全基因组关联分析

彭小爱 卢茂昂 张玲 刘童 曹磊 宋有洪 郑文寅 何贤芳 朱玉磊

作物学报2024,Vol.50Issue(8):1948-1960,13.
作物学报2024,Vol.50Issue(8):1948-1960,13.DOI:10.3724/SP.J.1006.2024.31052

基于55K SNP芯片的小麦籽粒主要品质性状的全基因组关联分析

Genome-wide association study of major grain quality traits in wheat based on 55K SNP arrays

彭小爱 1卢茂昂 1张玲 1刘童 1曹磊 1宋有洪 1郑文寅 1何贤芳 2朱玉磊1

作者信息

  • 1. 安徽农业大学农学院,安徽合肥 230036
  • 2. 安徽省农业科学院作物研究所,安徽合肥 230001
  • 折叠

摘要

Abstract

To meet people's demand for wheat quality,exploring relevant candidate genes can provide a theoretical basis for ge-netic improvement and molecular marker-assisted selection of high-quality wheat cultivars.In this study,phenotypic values of eight wheat grain quality traits,including water absorption,grain protein content,volume weight,wet gluten content,dough sta-bility time,dough development time,sedimentation value,and flour yield,were detected in 118 wheat genotypes in three envi-ronments.The genotypes were analyzed using 55K SNP arrays,and a genome-wide association study was conducted using the Q+K mixed model.In three different environments,the eight grain quality traits had extensive variation,the maximum variation coefficient of sedimentation value was 16.47%-17.03%,and the heritability of each quality trait was 0.71-0.85.The 118 wheat genotypes were divided into three subgroups:subgroup Ⅰ,consisting of 41(34.75%)genotypes,mainly from Anhui;subgroup Ⅱ,consisting of 32(27.12%)genotypes,predominantly from Anhui,Jiangsu,and Sichuan provinces;and subgroup Ⅲ,consisting of 45(38.13%)genotypes,mainly from Anhui and Jiangsu provinces.22 stable loci significantly associated with wheat grain quality traits(P<0.001)were repeatedly detected in two or three environments,distributed on chromosomes 1B(4),1D(1),2B(1),2D(1),3B(2),3D(1),4D(1),5A(1),5B(1),5D(3),6B(2),7B(3),and 7D(1),explaining 8.53%to 16.32%of the phenotypic variation.Among the stable loci,three exhibited significant pleiotropic effects,14 were identified as novel loci for controlling wheat quality traits,and 11 candidate genes possibly associated with wheat grain quality traits were screened.The higher the number of favorable alleles,the higher the phenotypic values of quality traits.Furthermore,it was discovered that several geno-types carried favorable alleles for all eight major quality traits.Among them,the wheat cultivars Huacheng 859 and Jimai 44 con-tained the highest number of favorable alleles,making them valuable breeding parents for improving wheat quality.The results of this study provide a theoretical basis,parental materials,and molecular markers for the breeding of high-quality wheat.

关键词

小麦/品质性状/全基因组关联分析/55K芯片/有利等位基因

Key words

Triticum aestivum L./quality traits/genome-wide association study/55K array/favorable alleles

引用本文复制引用

彭小爱,卢茂昂,张玲,刘童,曹磊,宋有洪,郑文寅,何贤芳,朱玉磊..基于55K SNP芯片的小麦籽粒主要品质性状的全基因组关联分析[J].作物学报,2024,50(8):1948-1960,13.

基金项目

本研究由国家自然科学基金项目(31901540),青年骨干教师出国研修项目(202008775003)和安徽省重点研究与开发计划(202104f06020023)资助.This study was supported by the National Natural Science Foundation of China(31901540),the Youth Backbone Teachers Overseas Aca-demic Training Program(202008775003),and the Key Research and Development Plan of Anhui Province(202104f06020023). (31901540)

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