基于55K SNP芯片的小麦籽粒主要品质性状的全基因组关联分析OA北大核心CSTPCD
Genome-wide association study of major grain quality traits in wheat based on 55K SNP arrays
通过检测 118 份小麦材料 3 个环境下吸水率、蛋白质含量、容重、湿面筋含量、面团稳定时间、面团形成时间、沉降值和出粉率 8 个小麦籽粒品质的表型值,结合小麦 55K SNP芯片分析基因型,采用Q+K混合模型进行全基因组关联分析.在不同环境下,8 个籽粒品质性状均具有广泛变异,其中沉降值的变异系数最大为 16.47％～17.03％,各品质性状遗传力为 0.71～0.85.118 份小麦材料被分为 3 个亚群,亚群Ⅰ包括 41(34.75％)份,安徽供试材料占绝大部分;亚群Ⅱ包括 32(27.12％)份,是以安徽、江苏、四川为主体的群体;亚群Ⅲ包括 45(38.13％)份,主要为安徽及江苏省份材料.22 个与小麦籽粒品质性状显著关联的稳定位点(P<0.001)在 2 个及以上的环境中被重复检测到,分布于染色体 1B(4)、1D(1)、2B(1)、2D(1)、3B(2)、3D(1)、4D(1)、5A(1)、5B(1)、5D(3)、6B(2)、7B(3)和 7D(1),解释了 8.53％～16.32％的表型变异.稳定位点中包含 3 个一因多效显著关联位点,14 个可能控制小麦品质性状的新遗传位点,并筛选出 11 个可能与小麦籽粒品质性状相关的候选基因;有利等位基因的数量越多,品质性状表型值越高,并发现了在 8 个主要品质性状均携带有利等位基因的载体材料,其中,华成 859 和济麦 44 包含最多的有利等位基因,可供改良小麦品质的育种亲本使用.本研究结果为小麦优良品质小麦培育提供了理论依据、亲本材料和分子标记.
To meet people's demand for wheat quality,exploring relevant candidate genes can provide a theoretical basis for ge-netic improvement and molecular marker-assisted selection of high-quality wheat cultivars.In this study,phenotypic values of eight wheat grain quality traits,including water absorption,grain protein content,volume weight,wet gluten content,dough sta-bility time,dough development time,sedimentation value,and flour yield,were detected in 118 wheat genotypes in three envi-ronments.The genotypes were analyzed using 55K SNP arrays,and a genome-wide association study was conducted using the Q+K mixed model.In three different environments,the eight grain quality traits had extensive variation,the maximum variation coefficient of sedimentation value was 16.47％-17.03％,and the heritability of each quality trait was 0.71-0.85.The 118 wheat genotypes were divided into three subgroups:subgroup Ⅰ,consisting of 41(34.75％)genotypes,mainly from Anhui;subgroup Ⅱ,consisting of 32(27.12％)genotypes,predominantly from Anhui,Jiangsu,and Sichuan provinces;and subgroup Ⅲ,consisting of 45(38.13％)genotypes,mainly from Anhui and Jiangsu provinces.22 stable loci significantly associated with wheat grain quality traits(P<0.001)were repeatedly detected in two or three environments,distributed on chromosomes 1B(4),1D(1),2B(1),2D(1),3B(2),3D(1),4D(1),5A(1),5B(1),5D(3),6B(2),7B(3),and 7D(1),explaining 8.53％to 16.32％of the phenotypic variation.Among the stable loci,three exhibited significant pleiotropic effects,14 were identified as novel loci for controlling wheat quality traits,and 11 candidate genes possibly associated with wheat grain quality traits were screened.The higher the number of favorable alleles,the higher the phenotypic values of quality traits.Furthermore,it was discovered that several geno-types carried favorable alleles for all eight major quality traits.Among them,the wheat cultivars Huacheng 859 and Jimai 44 con-tained the highest number of favorable alleles,making them valuable breeding parents for improving wheat quality.The results of this study provide a theoretical basis,parental materials,and molecular markers for the breeding of high-quality wheat.
彭小爱;卢茂昂;张玲;刘童;曹磊;宋有洪;郑文寅;何贤芳;朱玉磊
安徽农业大学农学院,安徽合肥 230036安徽省农业科学院作物研究所,安徽合肥 230001
小麦品质性状全基因组关联分析55K芯片有利等位基因
Triticum aestivum L.quality traitsgenome-wide association study55K arrayfavorable alleles
《作物学报》 2024 (008)
1948-1960 / 13
本研究由国家自然科学基金项目(31901540),青年骨干教师出国研修项目(202008775003)和安徽省重点研究与开发计划(202104f06020023)资助.This study was supported by the National Natural Science Foundation of China(31901540),the Youth Backbone Teachers Overseas Aca-demic Training Program(202008775003),and the Key Research and Development Plan of Anhui Province(202104f06020023).
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