一种抗电磁故障注入攻击的电源端口布局优化方法OACSTPCD

Electromagnetic fault injection(EMFI)has become an effective fault injection attack technique threatening integrated circuit(IC)security.Existing research has demonstrated that EMFI perturbs circuits'internal states by inducing parasitic current on the IC power grid.Finite element analysis of the power grid under EMFI shows that the induced current could increase the IR drop of the power grid,leading to circuit faults.Therefore,to address this problem,we propose a power supply port placement optimization approach which reduces the effect of the induced current.The experiment results show that by optimizing the positions of the power supply ports,the worst IR drop can be reduced by 40％,enhancing the robustness of the power grid.