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悬浮液等离子喷涂制备Y2O3涂层及耐等离子刻蚀性OA北大核心CSTPCD

Preparation of Y2O3 Coating by Suspension Plasma Spraying and Its Resistance to Plasma Etching

中文摘要英文摘要

随着高端芯片竞争的白热化,Y2O3 涂层作为等离子体刻蚀工艺腔的重要组成部分,对其研究逐渐成为科研热点.利用悬浮液等离子喷涂(Suspension Plasma Spraying,SPS)在铝合金表面制备Y2O3 涂层,研究了不同工艺参数对涂层的物相组成、力学性能、显微形貌和介电强度等的影响;在 CF4/Ar/O2 氟等离子体环境中对 Y2O3 涂层分别刻蚀30、60、120 min后,分析了Y2O3 涂层微观孔隙率对刻蚀速率的影响.最优工艺 1(喷涂距离 80 mm、送液速率35 mL/min、雾化气流速 15 L/min、横向移枪速率 700 mm/s、纵向移动步进 1 mm/step)制备的Y2O3 涂层的显微硬度为(3.78±0.36)GPa,孔隙率为(2.35±0.24)%,结合强度为(36.0±3.6)MPa,介电强度为(29.74±2.01)kV/mm.在CF4/Ar/O2 组成的混合等离子气体中,Y2O3 涂层发生物理和化学反应,Ar+对涂层强烈冲击、轰击诱导,使表面化学键断裂;CF2*和F*使Y2O3 不断被刻蚀,生成的YF3附着在涂层表面;同时Ar+不断对涂层表面进行物理冲击,去除YF3 层,少量残余在涂层表面的YF3 被氧化形成了YOF,最终导致涂层刻蚀率低至(11.48±5.21)nm/min.高致密性、低孔隙率、高均匀性的Y2O3 涂层可以有效提高零件的耐等离子刻蚀性能,对半导体工业具有重要意义.

With the fierce competition of high-end chips,Y2O3 coating is an important component of plasma etching cavity,corresponding research gradually becomes a research hotspot.Y2O3 coating was prepared on aluminum alloy surface by suspension plasma spraying(SPS).The effects of different process parameters on the phase composition,mechanical properties,microstructure,and dielectric strength of the coating were studied.The effect of microscopic porosity of Y2O3 coating on etching rate was analyzed after etching in CF4/Ar/O2 mixture for 30,60 and 120 min,respectively.The microhardness,the porosity,the bonding strength,and the dielectric strength of Y2O3 coating prepared by the optimal process 1(spraying distance 80 mm,liquid feed rate 35 mL/min,atomizing gas flow rate 15 L/min,horizontal gun moving speed 700 mm/s,vertical moving step 1 mm/step)is(3.78±0.36)GPa,(2.35±0.24)%,(36.0±3.6)MPa,and(29.74±2.01)kV/mm,respectively.In the mixed plasma gas composed of CF4/Ar/O2,the Y2O3 coating undergoes physical and chemical reactions,while Ar+strongly shocks and bombards the coating to break the chemical bond on the surface.CF2* and F* make Y2O3 continuously etched to form YF3 attaching to the coating surface.At the same time,the physical impact of Ar+constantly acts on the surface of the coating,removing the YF3 layer,and a small amount of residual YF3 on the surface of the coating is oxidized and finally forms YOF,resulting in a coating etching rate as low as(11.48±5.21)nm/min.Y2O3 coating with high density,low porosity and high uniformity can effectively improve the resistance of parts to plasma etching,which is of great significance in semiconductor industry.

马文;申喆;刘琪;高元明;白玉;李荣星

内蒙古工业大学 材料科学与工程学院,内蒙古自治区薄膜与涂层重点实验室,呼和浩特 010051||内蒙古自治区稀土新材料及功能涂层工程研究中心,呼和浩特 010051

化学工程

悬浮液等离子喷涂Y2O3 涂层孔隙率耐等离子刻蚀性

suspension plasma sprayingY2O3 coatingporosityplasma etching resistance

《无机材料学报》 2024 (008)

929-936 / 8

内蒙古自然科学基金(2022MS05003,2021PT0008,JY20220041);内蒙古自治区高校创新科研团队项目(NMGIRT2319) Inner Mongolia Natural Science Foundation(2022MS05003,2021PT0008,JY20220041);Inner Mongolia University Innovative Research Team Project(NMGIRT2319)

10.15541/jim20230548

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