Data-Driven Fault Detection of Multiple Open-Circuit Faults for MMC Systems Based on Long Short-Term Memory NetworksOACSTPCDEI

This paper presents a long short-term memory(LSTM)-based fault detection method to detect the multiple open-circuit switch faults of modular multilevel converter(MMC)systems with full-bridge sub-modules(FB-SMs).Eighteen sensor signals of grid voltages,grid currents and capacitance voltages of MMC for single and multi-switch faults are collected as sampling data.The output signal characteristics of four types of single switch faults of FB-SM,as well as double switch faults in the same and different phases of MMC,are analyzed under the conditions of load variations and control command changes.A multi-layer LSTM network is devised to deeply extract the fault characteristics of MMC under different faults and operation conditions,and a Softmax layer detects the fault types.Simulation results have confirmed that the proposed LSTM-based method has better detection performance compared with three other methods:K-nearest neighbor(KNN),naive bayes(NB)and recurrent neural network(RNN).In addition,it is highly robust to model uncertainties and Gaussian noise.The validity of the proposed method is further demonstrated by experiment studies conducted on a hardware-in-the-loop(HIL)testing platform.