首页|期刊导航|CSEE Journal of Power and Energy Systems|Data-Driven Fault Detection of Multiple Open-Circuit Faults for MMC Systems Based on Long Short-Term Memory Networks

Data-Driven Fault Detection of Multiple Open-Circuit Faults for MMC Systems Based on Long Short-Term Memory NetworksOACSTPCDEI

中文摘要

This paper presents a long short-term memory(LSTM)-based fault detection method to detect the multiple open-circuit switch faults of modular multilevel converter(MMC)systems with full-bridge sub-modules(FB-SMs).Eighteen senso…查看全部>>

Chenxi Fan;Kaishun Xiahou;Lei Wang;Q.H.Wu

School of Electric Power Engineering,South China University of Technology,Guangzhou 510641,ChinaSchool of Electric Power Engineering,South China University of Technology,Guangzhou 510641,ChinaSchool of Electric Power Engineering,South China University of Technology,Guangzhou 510641,ChinaSchool of Electric Power Engineering,South China University of Technology,Guangzhou 510641,China

动力与电气工程

Fault detectionlong short-term memory(LSTM)modular multilevel converter(MMC)open circuit fault

《CSEE Journal of Power and Energy Systems》 2024 (4)

P.1563-1574,12

supported in part by the Guangdong Basic and Applied Basic Research Foundation under Grand No.2020A1515111100in part by the National Natural Science Foundation of China under Grant 52207106in part the Young Elite Scientists Sponsorship Program by CSEE under Grant CSEE-YESS-2022019.

10.17775/CSEEJPES.2022.05990

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