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Data-Driven Fault Detection of Multiple Open-Circuit Faults for MMC Systems Based on Long Short-Term Memory Networks

Chenxi Fan Kaishun Xiahou Lei Wang Q.H.Wu

CSEE Journal of Power and Energy Systems2024，Vol.10Issue(4)：P.1563-1574,12.

CSEE Journal of Power and Energy Systems2024，Vol.10Issue(4)：P.1563-1574,12.DOI:10.17775/CSEEJPES.2022.05990

Data-Driven Fault Detection of Multiple Open-Circuit Faults for MMC Systems Based on Long Short-Term Memory Networks

Chenxi Fan ¹Kaishun Xiahou ¹Lei Wang ¹Q.H.Wu¹

作者信息

1. School of Electric Power Engineering,South China University of Technology,Guangzhou 510641,China
折叠

摘要

关键词

Fault detection/long short-term memory(LSTM)/modular multilevel converter(MMC)/open circuit fault

分类

信息技术与安全科学

引用本文复制引用

Chenxi Fan,Kaishun Xiahou,Lei Wang,Q.H.Wu..Data-Driven Fault Detection of Multiple Open-Circuit Faults for MMC Systems Based on Long Short-Term Memory Networks[J].CSEE Journal of Power and Energy Systems,2024,10(4):P.1563-1574,12.

基金项目

supported in part by the Guangdong Basic and Applied Basic Research Foundation under Grand No.2020A1515111100 （）

in part by the National Natural Science Foundation of China under Grant 52207106 （）

in part the Young Elite Scientists Sponsorship Program by CSEE under Grant CSEE-YESS-2022019. （）

CSEE Journal of Power and Energy Systems

OACSTPCDEI

ISSN：2096-0042

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