| 注册
首页|期刊导航|数码设计|高可靠片式瓷介电容器典型缺陷模式及检测方法研究

高可靠片式瓷介电容器典型缺陷模式及检测方法研究

张绪灿

数码设计Issue(10):122-124,3.
数码设计Issue(10):122-124,3.

高可靠片式瓷介电容器典型缺陷模式及检测方法研究

Study on Typical Defect Patterns and Detection Methods of Highly Reliable Chip Porcelain Dielectric Capacitors

张绪灿1

作者信息

  • 1. 湖北信业热能工程有限公司,湖北黄石 435000
  • 折叠

摘要

Abstract

Capacitors play a vital role in aerospace electronics,and they are indispensable basic components in electronic circuits.These capacitors are widely used in circuits for purposes such as isolation,coupling,bypassing,filtering,tuning,oscillating circuits and so on.Ceramic dielectric capacitors are usually used for resonance,filtering,and coupling,etc.They are generally constructed using a surface-mounted multilayer stack,which consists of a metal inner electrode,a ceramic dielectric,and a metal outer electrode.The current problem is that the defects in the dielectric layer are not detected accordingly,and if there are defects such as voids in the dielectric layer,it is easy to lead to device failure.Therefore,there is a need to solve this problem by using carrying out ultrasonic scanning detection tests.

关键词

内部空洞/电极结瘤/内部分层/端电极缺陷/超声扫描

Key words

internal voids/electrode nodules/internal delamination/end-electrode defects/ultrasonic scanning

分类

信息技术与安全科学

引用本文复制引用

张绪灿..高可靠片式瓷介电容器典型缺陷模式及检测方法研究[J].数码设计,2024,(10):122-124,3.

数码设计

1672-9129

访问量0
|
下载量0
段落导航相关论文