红外技术2024，Vol.46Issue(10)：1130-1137,8.
EBAPS闪烁噪声测试系统
Flicker Noise Testing System of Electron Bombarded Active Pixel Sensor
摘要
Abstract
An electron bombarded active pixel sensor(EBAPS)is a novel vacuum-solid,hybrid,digital,low-light night vision device.Flicker noise is a key factor affecting the resolution and image quality of EBAPS;however,there is currently insufficient research on the testing of flicker noise in EBAPS.Hence,this study conducted research on EBAPS flicker noise testing methods using connected domain detection algorithms to filter out high-brightness noise spot areas and proposed an adaptive,median replacement,discrete coefficient testing method for abnormal pixel points.Based on these results,an EBAPS flicker-noise testing system was developed using the discrete coefficient and number of bright noise spots as parameters to characterize the flicker noise.The system drives the EBAPS to transfer image data collected under different test conditions to an upper computer for noise processing and analysis.The test results indicate that the appropriate test illuminance is 1.27×10-3 lx.Moreover,the number of high-brightness noise spots is relatively low in the-1000-1300 V range,and it significantly increases when the voltage is between-1300-1500 V.The repeatability of the discrete coefficient and number of connected domains was within 3%,thus verifying the stability of the testing system and providing an effective means by which to test flicker noise in domestic EBAPS.关键词
EBAPS/闪烁噪声/电子倍增/测试系统/连通域检测算法Key words
EBAPS/flicker noise/electronic multiplying/test system/connected domain detection algorithm分类
电子信息工程引用本文复制引用
罗振华,成帅,钱芸生,张益军..EBAPS闪烁噪声测试系统[J].红外技术,2024,46(10):1130-1137,8.基金项目
国家自然科学基金"叶企孙"科学基金项目(U2141239). （U2141239）
