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8英寸SiC晶圆制备与外延应用

韩景瑞 丁雄杰 李锡光 李咏梅 王垚浩 张清纯 李达 施建新 闫鸿磊 韩跃斌

人工晶体学报2024,Vol.53Issue(10):1712-1719,8.
人工晶体学报2024,Vol.53Issue(10):1712-1719,8.

8英寸SiC晶圆制备与外延应用

Preparation and Epitaxy Application of 8 Inch SiC Wafers

韩景瑞 1丁雄杰 1李锡光 1李咏梅 1王垚浩 2张清纯 3李达 4施建新 4闫鸿磊 4韩跃斌4

作者信息

  • 1. 广东天域半导体股份有限公司,东莞 523808
  • 2. 广州南砂晶圆半导体技术有限公司,广州 511458
  • 3. 清纯半导体(宁波)有限公司,宁波 315336
  • 4. 芯三代半导体科技(苏州)股份有限公司,苏州 215021
  • 折叠

摘要

Abstract

Silicon carbide(SiC)is one of the superior materials used in the manufacture of electronic components designed to work at high temperatures,high frequencies and high-power.In the past two decades,the application of SiC materials has been expanding as a result of much improved production and processing techniques.Although most SiC chips are still mainly made from 6 inch(1 inch=25.4 mm)wafers,leading manufacturers have begun developing next-generation parts and chips based upon 8 inch SiC wafers.This study collaborates with leading enterprises in the upstream and downstream of the domestic silicon carbide industry chain in order to facilitate domestic production of 8 inch SiC chips,with the focus being wafer preparation and epitaxial growth.In this work,8 inch conductive 4H-SiC substrate wafer was prepared by diameter expansion growth,with low average base plane dislocation(BPD)density(251 cm-2)and virtually'zero threading screw dislocation(TSD)'density(<1 cm-2)that meet the production requirements.Based on these 8 inch substrates,we achieve fast epitaxial growth(68.66 μm/h)with domestically produced 8 inch epitaxy equipment and processing packages.The thickness uniformity of the resultant wafers is 0.89%and the doping uniformity is 2.05%.These parameters,as well as the defect density,are on par with those of high-quality 6-inch wafers,fully meeting production requirements.The 8 inch wafers prepared in this paper are better than those described in international publications in terms of thickness and doping uniformity.The defect density is only 1/4 of international data.In this paper,multi-wafer repetative text was designed and executed,to verify the stability of 8 inch epitaxy.

关键词

碳化硅/8英寸/晶圆/外延/缺陷密度/掺杂均匀性

Key words

silicon carbide/8 inch/wafer/epitaxy/defect density/doping uniformity

分类

信息技术与安全科学

引用本文复制引用

韩景瑞,丁雄杰,李锡光,李咏梅,王垚浩,张清纯,李达,施建新,闫鸿磊,韩跃斌..8英寸SiC晶圆制备与外延应用[J].人工晶体学报,2024,53(10):1712-1719,8.

基金项目

江苏省重大科技成果转化项目(BA2022082) (BA2022082)

人工晶体学报

OA北大核心CSTPCD

1000-985X

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