首页|期刊导航|Journal of Semiconductors|First demonstration of a self-aligned p-channel GaN back gate injection transistor
Journal of Semiconductors2024,Vol.45Issue(11):P.69-73,5.DOI:10.1088/1674-4926/24050027
First demonstration of a self-aligned p-channel GaN back gate injection transistor
摘要
关键词
GaN/p-FETs/self-alignment/back gate/threshold hysteresis/conductivity modulation分类
信息技术与安全科学引用本文复制引用
Yingjie Wang,Sen Huang,Qimeng Jiang,Jiaolong Liu,Xinhua Wang,Wen Liu,Liu Wang,Jingyuan Shi,Jie Fan,Xinguo Gao,Haibo Yin,Ke Wei,Xinyu Liu..First demonstration of a self-aligned p-channel GaN back gate injection transistor[J].Journal of Semiconductors,2024,45(11):P.69-73,5.基金项目
supported in part by the National Key Research and Development Program of China under Grant2022YFB3604400 ()
in part by the Youth Innovation Promotion Association of Chinese Academy Sciences(CAS) (CAS)
in part by CAS-Croucher Funding Scheme under Grant CAS22801 ()
in part by National Natural Science Foundation of China under Grant 62334012,Grant 62074161,Grant 62004213,Grant U20A20208 ()
Grant 62304252 ()
in part by the Beijing Municipal Science and Technology Commission project under Grant Z201100008420009 and Grant Z211100007921018 ()
in part by the University of CAS ()
in part by IMECAS-HKUST-Joint Laboratory of Microelectronics。 ()