Journal of Semiconductors2024,Vol.45Issue(12):P.152-158,7.DOI:10.1088/1674-4926/24090027
Displacement damage effects in MoS_(2)-based electronics
摘要
关键词
MoS_(2)/field effect transistor/displacement damage effect/radiation hardness/proton radiation分类
信息技术与安全科学引用本文复制引用
Kaiyue He,Zhanqi Li,Taotao Li,Yifu Sun,Shitong Zhu,Chao Wu,Huiping Zhu,Peng Lu,Xinran Wang,Maguang Zhu..Displacement damage effects in MoS_(2)-based electronics[J].Journal of Semiconductors,2024,45(12):P.152-158,7.基金项目
supported by the National Natural Science Foundation of China (Grant No.62301247) (Grant No.62301247)
the Fundamental Research Funds for the Central Universities (Grant No.2024300427) (Grant No.2024300427)
the Natural Science Foundation of Jiangsu Province (Grant No.BK20230778) (Grant No.BK20230778)
the Key Research and Development Program of Jiangsu Province (Grant No.BK20232009) (Grant No.BK20232009)
the Innovation Leading Talent Foundation of Suzhou (Grant No.ZXL2023164) (Grant No.ZXL2023164)
Guangdong Major Project of Basic Research (Grant No.2021B0301030003) (Grant No.2021B0301030003)
Jihua Laboratory (Project No.X210141TL210). (Project No.X210141TL210)