电瓷避雷器Issue(6)：92-98,7.DOI:10.16188/j.isa.1003-8337.2024.06.011
SnO2压敏电阻交流老化机理的探索
AC Aging Mechanism of SnO2 Varistor
摘要
Abstract
Through accelerated aging test of SnO2 varistor with equivalent time,samples with different ag-ing times were measured by means of current-voltage(E-J),capacitance-voltage(C-V)and scan-ning electron microscopy(SEM),and the changes of macroscopic electrical properties and microscopic parameter structure were compared and analyzed.The results show that the E1mA,E0.1mA and φb have edged up first,and then down slowly,the trend of a sharp drop in again;α,JL slowly decrease first and then decreases rapidly,it is concluded that lingers model with carrier trap theory plays a leading role in the early aging,carrier trap with ion migration theory play a dominant role in the medium term,while the high leakage current linear breakdown theory that thermal destruction proliferation dominate the aging of the late communication.关键词
SnO2压敏电阻/交流老化/压敏电压/非线性Key words
SnO2 varistor/AC aging/pressure sensitive voltage/non-linearity引用本文复制引用
杨岱礼,赵洪峰,王锋,谢清云,蒙晓记..SnO2压敏电阻交流老化机理的探索[J].电瓷避雷器,2024,(6):92-98,7.基金项目
新疆自治区自然科学基金(编号:2022D01 C21).Project supported by National Natural Science Foundation of Xinjiang Autonomous Region(No.2022D01C21). （编号:2022D01 C21）
