现代电子技术2025，Vol.48Issue(4)：30-33,4.DOI:10.16652/j.issn.1004-373x.2025.04.005
基于SIP的FPGA驱动电压补偿测试研究
Research on FPGA driver voltage compensation testing based on SIP
黄健 1陈诚 1王建超 1李岱林 1杜晓冬1
作者信息
- 1. 中国电子科技集团公司第五十八研究所,江苏 无锡 214035
- 折叠
摘要
Abstract
In the performance parameter verification testing of field-programmable gate arrays(FPGA)based on system in package(SIP),the driver voltage testing is influenced by various factors,such as PCB line resistance,socket signal loss,and testing temperature,which lead to discrepancies between the measured values and the true values in automated test equipment(ATE)testing.In order to enhance the testing accuracy of the driver voltage,a method of error compensation based on convolutional neural networks(CNN)and long short-term memory(LSTM)networks is proposed.By inputting parameters such as PCB line length and testing temperature into the CNN-LSTM model,the model can predict the error value of the driver voltage after training and iteration.The predicted error value is applied to the ATE tester to compensate and correct the measured values,so as to make the testing results closer to the true values.The experimental results demonstrate the proposed method can effectively reduce testing errors and improve the accuracy of FPGA driver voltage testing.关键词
驱动电压测试/误差补偿/系统级封装(SIP)技术/现场可编程门阵列/卷积神经网络/长短时记忆网络Key words
driver voltage testing/error compensation/system in package technology/field-programmable gate array/convolutional neural network/long short term memory network分类
信息技术与安全科学引用本文复制引用
黄健,陈诚,王建超,李岱林,杜晓冬..基于SIP的FPGA驱动电压补偿测试研究[J].现代电子技术,2025,48(4):30-33,4.
