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Random Illumination Microscopy:faster,thicker,and aberration-insensitive

Boya Jin Peng Xi

光:科学与应用(英文版)2025,Vol.14Issue(1):15-17,3.
光:科学与应用(英文版)2025,Vol.14Issue(1):15-17,3.DOI:10.1038/s41377-024-01687-9

Random Illumination Microscopy:faster,thicker,and aberration-insensitive

Random Illumination Microscopy:faster,thicker,and aberration-insensitive

Boya Jin 1Peng Xi1

作者信息

  • 1. Department of Biomedical Engineering,College of Future Technology,Peking University,Beijing 100871,China||National Biomedical Imaging Center,Peking University,Beijing 100871,China
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摘要

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Boya Jin,Peng Xi..Random Illumination Microscopy:faster,thicker,and aberration-insensitive[J].光:科学与应用(英文版),2025,14(1):15-17,3.

光:科学与应用(英文版)

2095-5545

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