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基于mist CVD的高纯相α-Ga2O3生长与光电响应特性研究

姚苏昊 张茂林 季学强 杨莉莉 李山 郭宇锋 唐为华

人工晶体学报2025,Vol.54Issue(2):233-243,11.
人工晶体学报2025,Vol.54Issue(2):233-243,11.DOI:10.16553/j.cnki.issn1000-985x.2024.0260

基于mist CVD的高纯相α-Ga2O3生长与光电响应特性研究

Mist CVD Grown High-Phase-Purity α-Ga2O3 and Its Photoresponse Performance

姚苏昊 1张茂林 2季学强 2杨莉莉 2李山 2郭宇锋 3唐为华2

作者信息

  • 1. 南京邮电大学,集成电路科学与工程学院氧化镓半导体创新中心,南京 210023
  • 2. 南京邮电大学,集成电路科学与工程学院氧化镓半导体创新中心,南京 210023||南京邮电大学,射频集成与微组装技术国家地方联合工程实验室,南京 210023
  • 3. 南京邮电大学,射频集成与微组装技术国家地方联合工程实验室,南京 210023
  • 折叠

摘要

Abstract

Ultra-wide bandgap semiconductor gallium oxide(Ga2O3)has important applications in power electronics and information sensing,its efficient and economical preparation is important to realize its industrial promotion.In this paper,a Sn-assisted mist chemical vapor deposition(mist CVD)technique is reported,based on which high-quality pure-phaseα-Ga2O3 thin films were successfully epitaxially grown on c-plane sapphire substrates by this non-vacuum,low-cost method.The mist CVD growth temperature regulation experiment shows that the temperature for epitaxial growth of pure-phase α-Ga2O3 thin films is between 500 and 600℃.The physical phase,morphology,optical features,elemental content and valence of the pure-phase α-Ga2O3 thin films were characterized by using X-ray diffraction(XRD),scanning electron microscopy(SEM),UV-visible spectrophotometer,and X-ray photoelectron spectrometer(XPS)techniques.The results indicate that the α-Ga2O3 thin films grown at the temperature of 600℃possess a higher degree of crystallinity,a denser and flatter surface morphology.Further,the deep-UV(DUV)photoresponse properties of α-Ga2O3 thin films were investigated by constructing photodetectors with metal-semiconductor-metal(MSM)structures.For α-Ga2O3 thin films prepared at 500 and 600 ℃,the photodetectors show photo-to-dark curr-ent ratios(PDCR)of 5.85×105 and 7.48 × 103,external quantum efficiencies(EQE)of 21.8%and 520%,and responsivities of 0.044 and 1.09 A/W,respectively.Under 6 V bias voltage and 254 nm illumination,the response time is 0.97/0.36 s for α-Ga2O3 thin film grown at 500 ℃,while it increases to 2.89/4.92 s for the sample grown at 600 ℃,which may be ascribed to the formation of donor impurities within the α-Ga2O3 thin films by Sn-assisted growth,and affecting the carrier transport efficiency.

关键词

α-Ga2O3/雾相化学气相沉积/Sn辅助生长/光电响应/沉积温度/掺杂激活

Key words

α-Ga2O3/mist chemical vapor deposition/Sn-assisted growth/photoresponse/deposition temperature/doping activation

引用本文复制引用

姚苏昊,张茂林,季学强,杨莉莉,李山,郭宇锋,唐为华..基于mist CVD的高纯相α-Ga2O3生长与光电响应特性研究[J].人工晶体学报,2025,54(2):233-243,11.

基金项目

国家重点研发计划(2022YFB3605404) (2022YFB3605404)

国家自然科学基金联合项目(U23A20349) (U23A20349)

江苏省双创人才团队项目(JSSCTD202351) (JSSCTD202351)

人工晶体学报

OA北大核心

1000-985X

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