现代电子技术2025，Vol.48Issue(6)：39-44,6.DOI:10.16652/j.issn.1004-373x.2025.06.006
基于TDDB的数字隔离器寿命测试系统
TDDB-based lifespan testing system for digital isolators
摘要
Abstract
In order to evaluate the stability and longevity of digital isolators during long-term usage,a lifespan testing system based on time-dependent dielectric breakdown(TDDB)is proposed,which can enhance testing efficiency by means of automation and multi-channel parallel testing.The specific method includes designing a 16-channel testing system,using DSP control program and PC software for data processing,and accelerating the aging test by increasing the voltage stress.The experimental results show that this system can immediately terminate the test and automatically record the failure time upon detecting a failure,while improving the reliability of testing results by simulating working voltage environments.In comparison with traditional methods,the designed system can significantly reduce manual intervention,enhance testing efficiency and reliability,and can preemptively warn of potential failures,providing strong assurance for the stable operation of electrical systems.This research has a certain theoretical and practical significance for improving the reliability and lifespan of digital isolators and ensuring the safe operation of electrical systems.关键词
数字隔离器/经时击穿/寿命测试/可靠性评估/栅氧化层击穿/回路电流监测Key words
digital isolator/time-dependent dielectric breakdown/lifespan testing/reliability assessment/gate oxide layer breakdown/loop current monitoring分类
信息技术与安全科学引用本文复制引用
李梓腾,王进军,陈炫宇,王凯..基于TDDB的数字隔离器寿命测试系统[J].现代电子技术,2025,48(6):39-44,6.基金项目
陕西省教育厅科研计划专项项目:A1GaN/GaN HEMT电力电子器件的优化与性能研究(18JK0103) （18JK0103）
