现代电子技术2025，Vol.48Issue(6)：113-117,5.DOI:10.16652/j.issn.1004-373x.2025.06.018
运放失调电压的激光修调测试
Laser trimming testing of operational amplifier offset voltage
李灿 1程法勇 1郭晓宇 1王建超 1韩先虎1
作者信息
- 1. 中国电子科技集团公司第五十八研究所,江苏 无锡 214035
- 折叠
摘要
Abstract
The application of high-precision operational amplifiers is becoming popular increasingly.Due to the limitations of integrated circuit manufacturing technology,the input transistor and load resistance of operational amplifiers cannot be matched completely.Therefore,it is necessary to improve the matching degree of the input stage of the operational amplifier by means of trimming methods to reduce the offset voltage.The definition and the causes of operational amplifier offset voltage are introduced,and the testing methods for offset voltage are analyzed.The commonly used offset voltage trimming methods are introduced and compared,and the advantages of laser trimming are summarized.The principle of laser trimming of offset voltage is analyzed,and based on several commonly used cutting methods for laser trimming,the hat-type resistor dual wire cutting method is selected.In order to realize higher accuracy and yield,a method for online laser trimming was proposed.The superiority of online laser trimming was verified by means of comparative analysis of testing data.关键词
运算放大器/失调电压/激光修调/自动测试系统/集成电路/制造工艺Key words
operational amplifier/offset voltage/laser trimming/automatic test system/integrated circuit/manufacturing process分类
电子信息工程引用本文复制引用
李灿,程法勇,郭晓宇,王建超,韩先虎..运放失调电压的激光修调测试[J].现代电子技术,2025,48(6):113-117,5.
