摘要
Abstract
In this paper,the phenomenon of angle selection of InSb materials with near-zero refractive index is stud-ied.The multilayer structure is composed of the main structure and anti-reflection structure.The main structure is used to generate the angle selection phenomenon,while the anti-reflection structure is used to suppress the leakage of electromag-netic wave.The results show that for the THz TE wave,a significant angle selection window is generated near 2.65 THz,while for the THz TM wave,the window is generated near 10.5 THz.For different polarization forms,temperature control can significantly adjust the angle range of the angle window.In addition,the critical angle characteristic is very sensitive to the refractive index change of the background medium,and the measurement range can be extended by temperature control.When the temperature is 300 K,298 K,296 K,respectively,the measurement range is 1.1～1.3 RIU,1.3～1.5 RIU,1.5～1.7 RIU.Compared with the constant temperature measurement,the refractive index measurement range is expanded by 200%.This structure uses a novel critical angle principle for refractive index sensing,and extends the detection range through tempera-ture control,which provides a new idea for the development of optical sensors.关键词
近零折射率/角度选择结构/温控/太赫兹/可变量程/折射率传感器Key words
near-zero refractive index/angle selection structure/temperature control/THz/variable measurement range/refractive index sensor分类
信息技术与安全科学
