科技创新与应用2025，Vol.15Issue(8)：58-63,6.DOI:10.19981/j.CN23-1581/G3.2025.08.013
基于小波变换的TFT-LCD屏Mura缺陷检测
摘要
Abstract
In order to realize automatic detection of Mura defects in TFT-LCD,an automatic Mura defect recognition algorithm based on wavelet transform is proposed for the characteristics of low contrast and uneven background brightness.First,image preprocessing is carried out on the Mura defect image collected by a CCD camera.Then,a suitable wavelet function is selected based on the wavelet transform to perform the wavelet transform.Then,the detailed image after wavelet transformation is processed and analyzed to obtain the contour edge of the Mura defect.Finally,image processing is carried out according to the Mura outline to obtain the corresponding Mura defect area.Experimental results show that when detecting Mura defects,the algorithm detects 100 Mura images,the accuracy rate reaches 98%,especially for 20 Mura images with serious uneven brightness on the defect background,the recognition rate is 100%.It meets the requirements of AOI equipment for stability,reliability,high precision,and strong anti-interference capabilities.关键词
LCD/小波变换/Mura缺陷/缺陷检测/AOIKey words
LCD/wavelet transform/Mura defect/defect detection/AOI分类
信息技术与安全科学引用本文复制引用
靳宏,左右祥,陶素连..基于小波变换的TFT-LCD屏Mura缺陷检测[J].科技创新与应用,2025,15(8):58-63,6.基金项目
2022年广东省普通高校青年创新人才类项目(2022KQNCX202) （2022KQNCX202）
2021年省高职教育教改项目(GDJG2021237) （GDJG2021237）
广东水利电力职业技术学院2022年度青年创新人才类项目(XK202214) （XK202214）
