实验科学与技术2025，Vol.23Issue(2)：54-61,89,9.DOI:10.12179/1672-4550.20230530
基于运算放大器的集成电路测试系统设计实验
Design Experiment of the Integrated Circuit Testing System Based on Operational Amplifiers
摘要
Abstract
The shortage of integrated circuit testing talents and insufficient analysis of operational amplifier parameters in undergraduate teaching practice are two issues in current China.The experiment is a student-oriented comprehensive design experiment,including two progressive courses,namely test adapter design and automatic testing software development.The testing circuits for three typical operational amplifier parameters are provided in this article.The impact of the interaction of various parameters on measurement accuracy are analyzed and the means to reduce the impact are proposed.The design method of remote multi-parameter and multi-range switching circuit is given,for meeting the requirement of automatic test.As verified,the experimental results produced by the test system are consistent with the specified parameter range by the datasheet of the operational amplifier.The experiment includes the complete design flow of integrated circuit automatic test system,which provides the students not only the design practice for hardware circuits,embedded software and upper computer software,but also improves their system level design capability.关键词
运算放大器/自动测试系统/测试适配器/实践教学Key words
operational amplifier/automatic test system/test adapter/practical teaching分类
社会科学引用本文复制引用
苟轩,黄敏,刘科..基于运算放大器的集成电路测试系统设计实验[J].实验科学与技术,2025,23(2):54-61,89,9.基金项目
2024年第一批次产学合作协同育人项目(231003084073047,231102278092204). （231003084073047,231102278092204）
