高压物理学报2025，Vol.39Issue(4)：9-15,7.DOI:10.11858/gywlxb.20240946
基于激光X射线源单晶XRD的晶格参数精度提升
Improvement of Lattice Parameter Accuracy in Single Crystal XRD Based on a Laser-Induced X-Ray Source
摘要
Abstract
The lattice parameter,measured with sufficient accuracy,can be utilized to evaluate the quality of single crystals and to determine the equation of state for materials.We propose an iterative method for obtaining more precise lattice parameters using the interaction points for the pseudo-Kossel pattern obtained from laser-induced X-ray diffraction(XRD).This method has been validated by the analysis of an XRD experiment conducted on iron single crystals.Furthermore,the method was used to calculate the compression ratio and rotated angle of an LiF sample under high pressure loading.This technique provides a robust tool for in-situ characterization of structural changes in single crystals under extreme conditions.It has significant implications for studying the equation of state and phase transitions.关键词
晶格参数/测量精度/单晶X射线衍射/迭代算法/高压/压缩度Key words
lattice parameter/measurement accuracy/single crystal X-ray diffraction/iterative algorithm/high pressure/ratio of compression引用本文复制引用
刘进,王倩男,李江涛..基于激光X射线源单晶XRD的晶格参数精度提升[J].高压物理学报,2025,39(4):9-15,7.基金项目
National Natural Science Foundation of China(12102410) （12102410）
Fund of National Key Laboratory of Shock Wave and Detonation Physics(JCKYS2022212005) （JCKYS2022212005）
