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Three-Dimensional Reconstruction Method Based on Infrared Deflectometry

Ping XIONG Jing ZHAO Jinping CHEN Hao HU Jiangping CAO

光子传感器(英文版)2025,Vol.15Issue(2):63-69,7.
光子传感器(英文版)2025,Vol.15Issue(2):63-69,7.DOI:10.1007/s13320-025-0757-1

Three-Dimensional Reconstruction Method Based on Infrared Deflectometry

Three-Dimensional Reconstruction Method Based on Infrared Deflectometry

Ping XIONG 1Jing ZHAO 2Jinping CHEN 3Hao HU 3Jiangping CAO4

作者信息

  • 1. School of Materials and Environmental Engineering,Chengdu Technological University,Chengdu 611730,China
  • 2. School of Network & Communication Engineering,Chengdu Technological University,Chengdu 611730,China
  • 3. School of Optoelectronic Science and Engineering,University of Electronic Science and Technology of China,Chengdu 610054,China
  • 4. National Institute of Measurement and Testing Technology,Chengdu 610021,China
  • 折叠

摘要

关键词

3D reconstruction/infrared deflectometry/stripe detection

Key words

3D reconstruction/infrared deflectometry/stripe detection

引用本文复制引用

Ping XIONG,Jing ZHAO,Jinping CHEN,Hao HU,Jiangping CAO..Three-Dimensional Reconstruction Method Based on Infrared Deflectometry[J].光子传感器(英文版),2025,15(2):63-69,7.

基金项目

This work was supported by the Talent Project of Chengdu Technological University,China(Grant No.2023RC013).The authors would like to thank all reviewers for their helpful comments and suggestions on this paper. (Grant No.2023RC013)

光子传感器(英文版)

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