集成电路与嵌入式系统2025，Vol.25Issue(4)：72-78,7.DOI:10.20193/j.ices2097-4191.2024.0063
基于ATE的PMIC参数测试关键技术研究
Research on key technologies of PMIC parameter testing based on ATE
摘要
Abstract
This paper proposes a simulation chip performance testing scheme based on Huafeng's STS8200,using the UC3842 chip as an example.The paper investigates the testing methods and procedures for several important parameters of the chip,including reference voltage,load regulation,line regulation,oscillator frequency,and rise and fall time.The experimental verification showed that the re-sults of each parameter were within the effective value range.After testing 10 chips and performing a 100-loop test on the 10th chip,the test yield of the chip was 100％,demonstrating the validity and effectiveness of the testing scheme.关键词
PMIC/ATE/性能测试/测试数据分析/STS8200Key words
PMIC/ATE/performance testing/test data analysis/STS8200分类
计算机与自动化引用本文复制引用
温志贤,杨红亮,褚夫邈..基于ATE的PMIC参数测试关键技术研究[J].集成电路与嵌入式系统,2025,25(4):72-78,7.基金项目
126kV环保型高压气体绝缘开关的研发(CYZC-2024-58) （CYZC-2024-58）
0309-2024010303003《现代电路理论》课程建设. （）
