发光学报2025，Vol.46Issue(4)：630-641,12.DOI:10.37188/CJL.20240310
X射线成像闪烁体光产额测量技术与优化方法
Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator
摘要
Abstract
Scintillation imaging screens are critical components in X-ray imaging technology.The accurate measure-ment of their light yield plays a pivotal role in improving the spatial resolution of imaging systems and advancing the de-velopment of new scintillators.This paper first provides an overview of the basic principles of X-ray imaging technolo-gy,followed by a review of the main methods for measuring light yield in X-ray imaging scintillators.These methods in-clude relative measurement techniques based on energy spectra and X-ray excitation spectra,as well as absolute mea-surement methods using photomultiplier tubes(PMTs)and photodiodes(PDs)or avalanche photodiodes(APDs).Ad-ditionally,this paper summarizes the potential impacts of various factors on light yield measurements,such as packag-ing and coupling technologies,the energy characteristics of the radiation source,particle types,and the types of photo-detectors used for light yield measurements.Furthermore,an absolute light yield measurement method is proposed based on correcting the light collection efficiency.This method effectively combines the advantages of the absolute measurement techniques using PMTs and PDs,achieving wide-range light yield measurements(covering light out-puts at the hundred-photons level)while maintaining a low measurement uncertainty of 5％.关键词
闪烁成像屏/光产额/测量方法/不确定度优化Key words
scintillating imaging screens/light yield/measurement methods/uncertainty optimization分类
核科学引用本文复制引用
张誉戈,马舸,万鹏颖,鲍子臻,欧阳潇,刘林月,欧阳晓平..X射线成像闪烁体光产额测量技术与优化方法[J].发光学报,2025,46(4):630-641,12.基金项目
科技部重点研发计划项目(2021YFB3201000) （2021YFB3201000）
国家自然科学基金(12050005)Supported by the Major State Basic Research Development Program of China(2021YFB3201000) （12050005）
National Natural Science Foundation of China(12050005) （12050005）
