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基于THZ-TDS镀银低辐射玻璃镀层质量及缺陷检测

李昶 路学光 陈科帆 黄婉霞 李建根 赵晓健 黄维 吴翔

太赫兹科学与电子信息学报2025,Vol.23Issue(4):353-359,7.
太赫兹科学与电子信息学报2025,Vol.23Issue(4):353-359,7.DOI:10.11805/TKYDA2024508

基于THZ-TDS镀银低辐射玻璃镀层质量及缺陷检测

Quality and defects of silver-plated Low-E glass coating based on THz-TDS

李昶 1路学光 1陈科帆 1黄婉霞 1李建根 2赵晓健 2黄维 2吴翔2

作者信息

  • 1. 四川大学 材料科学与工程学院,四川 成都 610040
  • 2. 四川南玻节能玻璃有限公司,四川 成都 610213
  • 折叠

摘要

Abstract

The performance and defect detection of Low-Emissivity(Low-E)glass are of great significance in its production.Currently,for Low-E glass with single,double,or multiple silver coatings,defect detection mainly relies on the analysis of visible light images,which presents certain limitations such as insufficient contrast and low identification efficiency.Terahertz waves can penetrate most non-conductive materials,making them highly effective for internal defect detection and structural analysis.Therefore,in this study,Terahertz Time-Domain Spectroscopy(THz-TDS)and scanning imaging technology based on this principle are employed to detect the coating structure and surface scratches of Low-E glass.By utilizing reflective THz-TDS and scanning imaging techniques,the waveform and intensity of the reflected terahertz pulse signals from glasses with different coating structures are investigated and the defect imaging is successfully achieved.This study demonstrates the feasibility of THz time-domain spectroscopy in the identification of glass coatings and defect detection.

关键词

太赫兹时域光谱/太赫兹成像/Low-E玻璃/无损检测/缺陷检测

Key words

Terahertz Time-Domain Spectroscopy(THz-TDS)/THz imaging/Low-Emissivity(Low-E)glass/nondestructive examination/defect detection

分类

数理科学

引用本文复制引用

李昶,路学光,陈科帆,黄婉霞,李建根,赵晓健,黄维,吴翔..基于THZ-TDS镀银低辐射玻璃镀层质量及缺陷检测[J].太赫兹科学与电子信息学报,2025,23(4):353-359,7.

太赫兹科学与电子信息学报

2095-4980

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