人工晶体学报2025，Vol.54Issue(4)：533-542,10.DOI:10.16553/j.cnki.issn1000-985x.2024.0248
原位诊断铌酸锂晶体生长界面的翻转现象
In-Situ Diagnosis of Lithium Niobate Crystal Growth Interface Flipping Phenomenon
摘要
Abstract
During Czochralski crystal growth,interface flipping is a frequent and concealed destructive phenomenon that induces interface instability and accumulate defects,ultimately degrading crystal quality.However,even for the widely-used Czochralski method,the interface flipping of a growing boule is unobservable.Therefore,presenting interface flipping process in the extreme high-temperature and sensitive crystal growth environment is crucial for understanding crystal growth,optimizing growth process,and hence improving crystal quality.Herein,benefitting from the time series analysis of growth interface electromotive force(GEMF),the interface flipping process during lithium niobate crystal growth was observed;and the quantitative relationship between GEMF trajectory and heat and mass transfer during interface flipping was revealed.Our GEMF method,applicable to the widely used melt growth furnace,provides real-time determination for interface flipping and offers feedback for interface control as well.关键词
铌酸锂/晶体生长/界面相本征电动势/原位诊断/界面翻转Key words
lithium niobate/crystal growth/growth interface electromotive force/in-situ diagnosis/interface flipping引用本文复制引用
蒋先龙,郑玮涛,朱允中..原位诊断铌酸锂晶体生长界面的翻转现象[J].人工晶体学报,2025,54(4):533-542,10.基金项目
国家自然科学基金(52372018) （52372018）
