集成电路与嵌入式系统2025，Vol.25Issue(5)：60-65,6.DOI:10.20193/j.ices2097-4191.2025.0007
CCD图像传感器失效模式及机理分析研究
Research on failure mode and mechanism analysis of CCD image sensor
蔡娜 1焦强 1田智文 1季轩 1周宇 1李昊 1张皓东 1李艳波 1李姗姗 1许明康1
作者信息
- 1. 中国航天标准化与产品保证研究院,北京 100071
- 折叠
摘要
Abstract
This article reviews the development of CCD image sensor technology.Based on the high reliability application requirements of CCD image sensors,it analyzed the product characteristics of CCD,categorizes the main failure modes,and conducted in-depth research on the failure mechanism of CCD due to electrostatic damage and irradiation.Furthermore,typical experimental verification work has been carried out,and failure variation curves under different irradiation conditions are presented.This study provides both theoretical foundations and experimental data for the high-reliability evaluation and failure analysis of CCD,thereby offering technical guidance for the high-reliability application of CCD products.关键词
CCD/光电探测器/失效模式及机理/静电损伤/辐照效应/电离效应Key words
CCD/photo detector/failure mode and mechanism/electrostatic discharge(esd)damage/radiation effect/ionization effect分类
计算机与自动化引用本文复制引用
蔡娜,焦强,田智文,季轩,周宇,李昊,张皓东,李艳波,李姗姗,许明康..CCD图像传感器失效模式及机理分析研究[J].集成电路与嵌入式系统,2025,25(5):60-65,6.
