计算机工程与科学2025，Vol.47Issue(5)：811-822,12.DOI:10.3969/j.issn.1007-130X.2025.05.005
一种新型低开销抗三节点翻转的锁存器设计
A novel low-overhead latch resistant to triple-node-upsets
摘要
Abstract
Under advanced nanoscale semiconductor processes,the continuous scaling down of tran-sistor feature sizes and the increasing level of integration have made radiation-induced triple-node-upsets increasingly prominent.To mitigate the impact of radiation particles on circuit reliability,a novel low-overhead NLC-TNUTL latch resistant to triple-node upsets is proposed.The design combines dual-mode redundancy technology with an interlocking mechanism based on the polarity inversion principle of transient pulses and input-separated inverters.HSPICE simulations and PVT variation analyses demon-strate that,compared to state-of-the-art radiation-hardened latches with equivalent fault tolerance,the proposed latch exhibits lower power consumption,reduced delay,and smaller area overhead.Addition-ally,it shows moderate sensitivity to threshold voltage,supply voltage,and temperature fluctuations while maintaining excellent cost-effectiveness.关键词
锁存器/电荷共享效应/辐射粒子/三节点翻转Key words
latch/charge sharing effect/radiation particles/triple-node-upset分类
电子信息工程引用本文复制引用
徐辉,唐琳,马瑞君,梁华国,黄正峰..一种新型低开销抗三节点翻转的锁存器设计[J].计算机工程与科学,2025,47(5):811-822,12.基金项目
国家自然科学基金(61834006,61874156,61404001) （61834006,61874156,61404001）
国家重大科研仪器研制项目(62027815) （62027815）
