| 注册
首页|期刊导航|现代应用物理|面阵CCD辐射敏感参数测试电路设计及试验验证

面阵CCD辐射敏感参数测试电路设计及试验验证

王祖军 黄港 李传洲 蒋镕羽 聂栩 晏石兴 唐宁

现代应用物理2025,Vol.16Issue(2):154-161,8.
现代应用物理2025,Vol.16Issue(2):154-161,8.DOI:10.12061/j.issn.2095-6223.202406002

面阵CCD辐射敏感参数测试电路设计及试验验证

Test Circuit Design and Radiation Experiment Verification of Array CCDs

王祖军 1黄港 2李传洲 2蒋镕羽 2聂栩 2晏石兴 2唐宁2

作者信息

  • 1. 强脉冲辐射环境模拟与效应全国重点实验室,西安 710024||湘潭大学材料科学与工程学院,湖南湘潭 411105
  • 2. 湘潭大学材料科学与工程学院,湖南湘潭 411105
  • 折叠

摘要

Abstract

The ICX285AL array charge coupled devices(CCDs)which are widely used in aerospace,scientific research,industrial applications,consumer electronics,and other fields are studied.A test circuit for testing the radiation sensitive parameters of array CCDs with field programmable gate array(FPGA)as the control core is designed.The test circuit mainly includes the FPGA control module,the CCD drive module,the analog-to-digital(A/D)correlated double sampling module,the data transmission module,and the power module.In terms of the hardware circuit design,the functional division of test circuit and the core chip selection of each module are carried out,the schematic diagram of test circuit is designed,and the layout and wiring of PCB board are optimized.Regarding the test circuit driver design,the FPGA driver is developed by Verilog HDL hardware description language,and the functions of image data acquisition,signal processing and conversion,data transmission and communication are realized by the FPGA timing control pulse.In this test circuit,the analog signal and the digital signal are separated to avoid the influence of the high-frequency digital signal on the high-precision analog signal.The typical characteristics of the CCD performance degradation induced by proton radiation are tested,and the reliability of the test circuit and its applicability to radiation effect test are verified.The research will provide the test technical support for the CCD radiation experiment research.

关键词

电荷耦合器件/测试电路设计/辐照试验/质子辐照/辐照损伤效应

Key words

charge coupled devices(CCD)/test circuit design/radiation test/proton irradiation/radiation damage effect

分类

信息技术与安全科学

引用本文复制引用

王祖军,黄港,李传洲,蒋镕羽,聂栩,晏石兴,唐宁..面阵CCD辐射敏感参数测试电路设计及试验验证[J].现代应用物理,2025,16(2):154-161,8.

基金项目

国家自然科学基金资助项目(U2167208,11875223) (U2167208,11875223)

陕西省自然科学基础研究计划资助项目(2024JC-JCQN-10) (2024JC-JCQN-10)

强脉冲辐射环境模拟与效应全国重点实验室基金资助项目(NKLIPR2320) (NKLIPR2320)

现代应用物理

2095-6223

访问量6
|
下载量0
段落导航相关论文