现代应用物理2025，Vol.16Issue(2)：169-177,9.DOI:10.12061/j.issn.2095-6223.202407059
内嵌处理器核FPGA瞬时剂量率效应损伤机制研究
Damage Mechanism of Transient Dose Rate Effect of Embedded Processor Core FPGA
摘要
Abstract
The FPGA with embedded processor cores is a large scale integrated circuit chip,which integrates processor core,FPGA,memory and memory interface,communication interface,debugging interface,and various controller interfaces.It can realize the functions of signal acquisition,conversion,storage,processing,and I/O control based on hardware and software.Aiming at a Zynq-7000 series embedded processor core FPGA integrated with the core of ARM Cortex-A9 series processor,a custom FPGA testing system is developed to test its radiation sensitivity of different working states in transient dose rate radiation environment.The radiation experiment is carried out at"Qiangguang-Ⅰ"accelerator.The radiation sensitivity,effect phenomenon,and law of effect is studied.In the process of increasing the transient dose rate from 4.5 ×106 Gy(Si)·s-1 to 3.7×109 Gy(Si)·s-1,the FPGA exhibited data disturbance phenomena,FPGA reset,PL dynamic,PS static and dynamic test function failure,JTAG interface read and write function failure,single-event latch-up(SEL)in peripheral I/O circuits and auxiliary voltage shared by PL and PS.This study provides data support for transient dose rate radiation damage assessment and reinforcement design of FPGA with embedded processor cores in a transient dose rate radiation environment.关键词
内嵌处理器核FPGA/瞬时剂量率效应/辐射效应规律/损伤机制Key words
FPGA with embedded processor core/transient dose rate effect/radiation effect law/damage mechanism分类
信息技术与安全科学引用本文复制引用
李俊霖,齐超,李瑞宾,刘岩,金晓明,王晨辉..内嵌处理器核FPGA瞬时剂量率效应损伤机制研究[J].现代应用物理,2025,16(2):169-177,9.基金项目
强脉冲辐射环境模拟与效应全国重点实验室基金资助项目(SKLIPR2202,NKLIPR2301) （SKLIPR2202,NKLIPR2301）
