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Safety behaviors and degradation mechanisms of aged batteries:A review

Shuguo Sun Jun Xu

能源材料与器件（英文）2024，Vol.2Issue(4)：1-28,28.

能源材料与器件（英文）2024，Vol.2Issue(4)：1-28,28.DOI:10.26599/EMD.2024.9370048

Shuguo Sun ¹Jun Xu¹

作者信息

1. Department of Mechanical Engineering,University of Delaware,Newark,DE 19716,USA||Energy Mechanics and Sustainability Laboratory(EMSLab),University of Delaware,Newark,DE 19716,USA
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battery safety/battery aging/internal short circuit/thermal runaway/modeling/characterization

battery safety/battery aging/internal short circuit/thermal runaway/modeling/characterization

Shuguo Sun,Jun Xu..Safety behaviors and degradation mechanisms of aged batteries:A review[J].能源材料与器件（英文）,2024,2(4):1-28,28.

Jun Xu appreciated the financial support from the research project from FM and startup funds provided by the University of Delaware. （）

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