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全国产化芯片继电保护装置可靠性测试关键技术研究及应用

张文 马全霞 王哲 何人可

电气技术2025,Vol.26Issue(6):68-74,7.
电气技术2025,Vol.26Issue(6):68-74,7.

全国产化芯片继电保护装置可靠性测试关键技术研究及应用

Research and application of key technologies for reliability testing of fully domesticated chip relay protection devices

张文 1马全霞 1王哲 1何人可1

作者信息

  • 1. 河南源网荷储电气研究院有限公司,河南 许昌 461000
  • 折叠

摘要

Abstract

Based on the characteristics of the fully domesticated chip relay protection device's software and hardware platforms,and addressing the key and difficult points in the testing process,this paper proposes a multi-CPU internal communication testing method for fully domesticated chip relay protection devices.Utilizing a dedicated internal detection module,the method simulates and monitors various normal and abnormal data without altering the original wiring layout,to verify the stability of internal communications between CPU boards.Additionally,this paper presents key technologies of internal communication reliability testing and platform application testing,details test plans for critical applications such as platform self-check,intelligent IO self-check,abnormal reset functions,and memory overflow risks,and summarizes typical on-site problem verification and key testing items.Finally,by comparing and analyzing the differences in key technical indicators between the"nine unified"devices and fully domesticated chip relay protection devices,the study offers insights for the product development of fully domesticated chip relay protection devices.

关键词

全国产化芯片/继电保护/异常模拟/可靠性

Key words

fully domesticated chip/relay protection/abnormal simulation/reliability

引用本文复制引用

张文,马全霞,王哲,何人可..全国产化芯片继电保护装置可靠性测试关键技术研究及应用[J].电气技术,2025,26(6):68-74,7.

电气技术

1673-3800

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