舰船电子工程2025，Vol.45Issue(4)：162-165,4.DOI:10.3969/j.issn.1672-9730.2025.04.034
基于逻辑分析仪的芯片测试向量生成方法
Test Pattern Generation Based on Logic Analyzer
沈郁博 1郭晗 1孔笑荷 1韩滔 1么鹏1
作者信息
- 1. 航天科工防御技术研究试验中心 北京 100039
- 折叠
摘要
Abstract
Test pattern is an important part of digital chip test engineering,it is used to detect and verify the function of the chip,this is achieved through the application of specific input signals and observing the output results to determine whether the chip has defects.Logic analyzer is a common signal measurement tool used to capture and analyze digital signals.The paper will use to generate a MCU chip USB interface test pattern as an example,focusing on the process of test pattern generation using a logic analyzer.关键词
测试向量/逻辑分析仪/芯片测试/V93000/VCDKey words
pattern/logic analyzer/chip testing/V93000/VCD分类
信息技术与安全科学引用本文复制引用
沈郁博,郭晗,孔笑荷,韩滔,么鹏..基于逻辑分析仪的芯片测试向量生成方法[J].舰船电子工程,2025,45(4):162-165,4.
