首页|期刊导航|自动化学报(英文版)|Beyond Performance of Learning Control Subject to Uncertainties and Noise:A Frequency-Domain Approach Applied to Wafer Stages
自动化学报(英文版)2025,Vol.12Issue(1):198-214,17.DOI:10.1109/JAS.2024.124968
Beyond Performance of Learning Control Subject to Uncertainties and Noise:A Frequency-Domain Approach Applied to Wafer Stages
Beyond Performance of Learning Control Subject to Uncertainties and Noise:A Frequency-Domain Approach Applied to Wafer Stages
摘要
关键词
Extended state observer/learning control/model uncertainties/motion control/stochastic noiseKey words
Extended state observer/learning control/model uncertainties/motion control/stochastic noise引用本文复制引用
Fazhi Song,Ning Cui,Shuaiqi Chen,Kai Zhang,Yang Liu,Xinkai Chen,Jiubin Tan..Beyond Performance of Learning Control Subject to Uncertainties and Noise:A Frequency-Domain Approach Applied to Wafer Stages[J].自动化学报(英文版),2025,12(1):198-214,17.基金项目
This work was supported by National Natural Science Foundation of China(52375530,52075132),Natural Science Foundation of Heilongjiang Province(YQ2022E025),State Key Laboratory of Precision Electronic Manufacturing Technology and Equipment(Guangdong University of Technology)(JMDZ202312),Fundamental Research Funds for the Central Universities(HIT.OCEF.2024034),China Postdoctoral Science Foundation(2019M651278,2020T130155),Heilongjiang Province Postdoctoral Science Foundation(LBH-Z19066),and Space Drive and Manipulation Mechanism Laboratory of BICE and National Key Laboratory of Space Intelligent Control,No BICE-SDMM-2024-01. (52375530,52075132)