航天器环境工程2025，Vol.42Issue(3)：270-275,6.DOI:10.12126/see.2025026
材料低温发射率测试装置及应用评估
Design and performance evaluation of low-temperature emissivity measurement systems for materials
马佳玉 1章俞之 1吴岭南 1于云 1宋力昕1
作者信息
- 1. 中国科学院上海硅酸盐研究所特种无机涂层研究中心,上海 200050
- 折叠
摘要
Abstract
To accurately evaluate the thermal radiation properties of thermal control materials in spacecraft cryogenic environments,two emissivity measurement systems were developed:a hemispherical emissivity measurement system based on the steady-state method,and a spectral emissivity measurement system based on the energy method.The former enables broadband hemispherical emissivity measurements from 60 to 300 K,while the latter enables spectral emissivity measurements in the mid-to far-infrared range(8-200 μm)at 30-300 K.Tests were conducted on white paint coatings and flexible thermal control films.Results indicate significant temperature dependence,with the hemispherical emissivity of the white paint coating increasing from 0.48 to 0.90 between 60 K and 220 K.Both systems demonstrate a combined standard uncertainty below 5%,providing reliable data to support the evaluation and thermal design of spacecraft thermal control materials.关键词
低温/热控材料/光谱发射率/半球发射率/中远红外Key words
cryogenic temperature/thermal control materials/spectral emissivity/hemispherical emissivity/mid-and far-infrared wavelengths分类
物理学引用本文复制引用
马佳玉,章俞之,吴岭南,于云,宋力昕..材料低温发射率测试装置及应用评估[J].航天器环境工程,2025,42(3):270-275,6.
