首页|期刊导航|半导体学报（英文版）|A simple and effective carrier lifetime characterization for semiconductor thin films

A simple and effective carrier lifetime characterization for semiconductor thin films

Bao Quy Le Tuan Nguyen Van Dat Tran Quang Vi Le Dinh Thin Pham Van Nguyen Cuc Thi Kim

半导体学报（英文版）2025，Vol.46Issue(7)：59-70,12.

半导体学报（英文版）2025，Vol.46Issue(7)：59-70,12.DOI:10.1088/1674-4926/24090005

A simple and effective carrier lifetime characterization for semiconductor thin films

Bao Quy Le ¹Tuan Nguyen Van ²Dat Tran Quang ²Vi Le Dinh ²Thin Pham Van ²Nguyen Cuc Thi Kim¹

作者信息

1. Precision Engineering&Smart measurements Lab,School of Mechanical Engineering,Hanoi University of Science and Technology,1 Dai Co Viet,100000 Hanoi,Vietnam
2. Department of Physics,Le Quy Don Technical University,100000 Hanoi,Vietnam
折叠

摘要

关键词

semiconductors/minority carrier lifetime/open circuit voltage decay/PbS thin films

Key words

semiconductors/minority carrier lifetime/open circuit voltage decay/PbS thin films

引用本文复制引用

Bao Quy Le,Tuan Nguyen Van,Dat Tran Quang,Vi Le Dinh,Thin Pham Van,Nguyen Cuc Thi Kim..A simple and effective carrier lifetime characterization for semiconductor thin films[J].半导体学报（英文版）,2025,46(7):59-70,12.

基金项目

This research is funded by The Vietnam Ministry of Educa-tion and Training under project number B2024-BKA-12. （）

半导体学报（英文版）

ISSN：1674-4926

访问量0

下载量0

段落导航