电子器件2025，Vol.48Issue(3)：495-500,6.DOI:10.3969/j.issn.1005-9490.2025.03.004
基于Xilinx 7系列FPGA的寄存器传输级故障注入模拟技术
Register Transfer Level Fault Injection Simulation Technology Based on Xilinx 7 Series FPGA
摘要
Abstract
Large-scale integrated circuits have been widely used in aerospace technology,but the single event effect induced by the cos-mic environment has an unpredictable impact on integrated circuits.The influence of single event failure on the RTL circuit of Xilinx 7 series FPGA is taken as the main research object.From three aspects of circuit configuration resources,script fault injection and circuit modification evaluation,the time division multiplexing mechanism is used to realize the mutual interference between fault operation and circuit operation.The configurable fault injection simulation technology is realized by resource allocation ID and retrieval instance level.The simulation test is carried out in the circuits of different bit multipliers.The results show that the proposed technology does not affect the normal operation of the original circuit and has the characteristics of low power consumption and fast fault injection speed.It has good applicability for large-scale integrated circuits.关键词
RTL电路/Xilinx7系列FPGA/故障注入/PythonKey words
RTL circuit/Xilinx7 series FPGA/fault injection/Python分类
信息技术与安全科学引用本文复制引用
华国环,蒋子昀..基于Xilinx 7系列FPGA的寄存器传输级故障注入模拟技术[J].电子器件,2025,48(3):495-500,6.基金项目
国家重点研发计划项目(2022YFB4401301) （2022YFB4401301）
