现代电子技术2025，Vol.48Issue(14)：17-24,8.DOI:10.16652/j.issn.1004-373x.2025.14.004
IGBT动态测试设备的驱动电路设计
Design of driving circuit for IGBT dynamic testing equipment
摘要
Abstract
In the field of modern power electronics,insulated gate bipolar transistor(IGBT)modules are widely used in various high-power applications due to their superior switching characteristics.In order to ensure the reliability and stability of IGBT modules,a series of tests,including dynamic testing,must be conducted before IGBT leaves the factory.However,there are differences in the IGBT products and their characteristics produced by different manufacturers.Therefore,IGBT dynamic testing equipment requires a driving circuit with strong adaptability that can provide effective driving and protection.A new-type driving circuit is designed to meet the testing equipment's needs for diverse IGBT module testing,ensuring the safety of the testing process and the accuracy of the testing results.The circuit has features:gate resistance regulation,drive voltage regulation,and multiple acquisition channels,enabling it to flexibly respond to different testing conditions.The integrated under-voltage and over-voltage protection mechanisms can effectively monitor the drive voltage,enhancing the circuit's reliability.Under experimental conditions of 460 V bus voltage and 650 A protection current,the effectiveness of the circuit in IGBT module testing is verified,thereby enhancing the performance and stability of IGBT dynamic testing equipment in high-power applications.关键词
IGBT/驱动电路/动态测试/测试设备/保护机制/驱动电压Key words
IGBT/driving circuit/dynamic testing/testing equipment/protection mechanism/drive voltage分类
信息技术与安全科学引用本文复制引用
杨熙程,郑永军,闫晗,郭斌,陆艺..IGBT动态测试设备的驱动电路设计[J].现代电子技术,2025,48(14):17-24,8.基金项目
浙江省科技计划项目"尖兵"研发攻关计划(2023C01061) （2023C01061）
