现代应用物理2025，Vol.16Issue(3)：100-106,7.DOI:10.12061/j.issn.2095-6223.202407057
微波脉冲串注入对PIN限幅器电恢复时间影响的物理仿真研究
Simulation Study of Injection Effects of Microwave Pulse Train on the Electrical Recovery Time in PIN Limiter
强凯 1涂敏 1李平 1王树龙 2闫涛 1张扬1
作者信息
- 1. 先进高功率微波技术重点实验室,西安 710024
- 2. 西安电子科技大学微电子学院,西安 710071
- 折叠
摘要
Abstract
In this paper,the physical model of the PIN diode is established using TCAD software,and the microwave simulation model of PIN diode limiter is built by the built-in SPICE module.By varying the microwave power injection and pulse interval,the relationship between the electrical recovery time of the PIN limiter and both the microwave power injection and the PIN diode junction temperature is investigated.The factors affecting the electrical recovery time are analyzed.The simulation results show that when the injected microwave power is the same,the higher the junction temperature,the lower the carrier recombination rate.This leads to slower carrier density decay toward steady-state operating conditions,consequently prolonging the electrical recovery time.when the junction temperature is the same,the higher the injected microwave power,the higher the carrier concentration in the I-layer.This increased concentration prolongs the time required for carrier density to decay to steady-state operating levels,thus extending the electrical recovery time.The optimal pulse interval for microwave pulse train injection approximately equals the PIN diode's electrical recovery time.Consequently,the total energy of microwave pulse train absorbed by PIN limiter can be greatly affected by the electrical recovery time.By setting the pulse interval to be equal to the electrical recovery time of PIN limiter,the temperature rise of PIN caused by microwave pulse train can be optimized.关键词
高功率微波/PIN限幅器/器件仿真/电热效应Key words
high power microwave/PIN limiter/device simulation/electrothermal effect分类
信息技术与安全科学引用本文复制引用
强凯,涂敏,李平,王树龙,闫涛,张扬..微波脉冲串注入对PIN限幅器电恢复时间影响的物理仿真研究[J].现代应用物理,2025,16(3):100-106,7.
